英伟达技术博客介绍使用X射线自由电子激光(XFEL)加速纳米材料成像,可追踪聚变材料、半导体、电池和催化等系统中的原子和电子动力学。
A massive-scale X-ray free-electron laser (XFEL) enables tracking structural and electron dynamics in novel systems, including fusion materials, semiconductors,...A massive-scale X-ray free-electron laser (XFEL) enables tracking structural and electron dynamics in novel systems, including fusion materials, semiconductors, batteries, and catalysis. It produces ultrashort X-ray pulses that can record the movements of atoms and electrons. These instruments can detect the smallest change in material structure caused by defects and other influences.
Source